Brief description of the thickness measurement device MIT-SCAN-T2

MIT-SCAN-T2 is a measuring device that accurately and non-destructively determines the thickness of asphalt or concrete pavement for construction purposes

An accurate measurement is critical for the thickness of road pavement to ensure compliance with the original design or for the longevity of pavement. The measurements can be taken on highway, municipal, harbor or airport pavements.

MIT-SCAN-T2 is an innovative measuring device that can non-destructively and accurately measure the thickness of pavement layers during construction without the requirement for coring. Low costs per test.

Schichtdickenmeßgerät MIT-SCAN-T2 für Fahrbahndecken in Asphalt und Beton